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International conference
2004
- Coupled Simulation Synchronized by Molecular and Dislocation Dynamics,
Tomohito Tsuru, Yoji Shibutani,
International Conference on Computational Methods,
(Dec 15-17 2004)
2003
- Ideal Shear Strength of fcc Metals
Shigenobu Ogata, Ju Li, Yoji Shibutani, and Sidney Yip
Abstract of 9th International Symposium on Physics of Materials
(Sep 1 2003)
- Nanoindentation and Atomistic Simulations
Yoji Shibutani
1st Molecular Dynamics Workshop (Aug. 29 2003)
- Ab Initio Study of Ideal Shear Strength
Shigenobu Ogata, Ju Li, Yoji Shibutani, and Sideney Yip
IUTAM Symposium on Mesoscopic Dynamics in Fracture Process and Strength
of Materials (July 10 2003)
- Dislocation Emission and Prismatic Dislocation Loop Formation of Single
Crystalline Aluminium under Nanoindenstation
Tomohito Tsuru and Yoji Shibutani
IUTAM Symposium on Mesoscopic Dynamics in Fracture Process and Strength
of Materials (July 8 2003)
- Estimation of Strength of Thin Film Using Nanoindentation
Atsuhiro Koyama, Makoto Tanno and Yoji Shibutani
The 9th International Conference on The Mechanical Behavior of Materials (May 25 2003)
2002-
- Crack propagation of silicon affected by surpace reconstruction on crack wake
using tight-binding molecular dynamics
Yoji Shibutani, Tetsuya Kugimiya, Peter Gumbsch
Designing of Interfacial Structures in Advanced Materials and their Joints 101-108 (Nov 2002, Osaka, Japan)
- Collective Dislocation Behavior in Single Aluminum under Indentation
Yoji Shibutani
IUTAM Symposium on Multiscale Modeling and Characterization of Elastic-Inelastic Behavior of Engineering Materials
October 10, 2002.
- FIB-TEM Observations of Cross Sections of Indent-induced Plastic Zone
Yoji Shibutani
14th US National Congress of Applied Mechanics (June 6 2002)
- First-principle and classical molecular dynamics study on tensile and shear
strength of silicon nitride
Shigenobu Ogata, Hiroshi Kitagawa, Naoto Hirosaki
Proceedings of 10th international conference of fracture, ICF100514OR (Invited) （Dec 2001, Hilton Hawaian Village, Honolulu） CD-ROM
- Crack-tip field analyses of silicon using order (N) tight-binding method
Tetsuya Kugimiya, Yoji Shibutani, Peter Gumbsch
Materials Science for the 21st Century Vol.B 285-288 (May 2001, Osaka, Japan)
[TOP][Papers][etc...]
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